> I did a quick test with a 41256 just now and was happy I could > read/write all bits successfully. Then I realized I don’t have any > known bad 4164/41256 type DRAM chips on hand. So, if you happen to have > a few bad DRAM chips on hand and you’re in the USA I would gladly take > them off your hands. I was going to suggest that, for testing purposes, you could extend the refresh interval far beyond specification. That would cause even a good RAM to fail, and, all being well, the failure would be detected and you'd know your test regimen is effective. Oops, but wait a sec... This raises a more general question. I hope your test regimen doesn't do its test reads too soon, because reading a cell also causes that cell to be refreshed. IOW, the test isn't fully comprehensive unless you write to a cell, leave it alone for one refresh interval, *then* do a read to verify its contents. Sorry if I'm stating the obvious; I'm just thinking out loud here! Have fun, and thanks for sharing your project with us. cheers, JeffReceived on 2020-05-29 22:48:57
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