On 13/09/2019 21:02, Jeffrey Birt wrote: > The original project I found online used separate functions for each > test pattern. I want to create a single function that will write a bit > pattern that is passed to it and then verify that pattern is in memory. While dram cells can fail completely, because of the analogue nature of dram you can find faults only occur during specific access paterns. So you probably should generate the bit patterns, using one of the many different algorithms that have been created over the years. A lot of ddr3 & ddr4 in use today are faulty if tested with rowhammerhttps://en.wikipedia.org/wiki/Row_hammer <https://en.wikipedia.org/wiki/Row_hammer>Received on 2020-05-29 22:50:00
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